Time domain and frequency domain measurements for transistor characterization

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dc.creator Loeb, H. W.
dc.date 2015-09-01T13:58:21Z
dc.date 2015-09-01T13:58:21Z
dc.date 1966-05
dc.date.accessioned 2022-05-09T09:54:54Z
dc.date.available 2022-05-09T09:54:54Z
dc.identifier http://dspace.lib.cranfield.ac.uk/handle/1826/9366
dc.identifier.uri https://reports.aerade.cranfield.ac.uk/handle/1826.2/4209
dc.language en
dc.publisher College of Aeronautics
dc.relation 100
dc.relation COA/M-100
dc.title Time domain and frequency domain measurements for transistor characterization
dc.type Report


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